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2016 crystal probe oscillator burn-in socket 4pin 2.0*1.6mm flip cover test fixture.
Introduction:
Product use: burn-in socket, test socket, high and low temperature burn in test of IC chips in 2016 (2.0*1.6mm).
Packages: 2016 (2.0*1.6mm) -4PIN crystal probe oscillator burn-in test socket.
Features:
1. Probe structure, using double contact technology, stable connection, small size.
2. Special engineering plastics are used, high strength, long life, small impedance, good elasticity.
3. Gold-plated layer thickening, contact thickening electroplating, ultra-low contact impedance, high reliability, service life (flip structure 20,000 times)
Parameters:
Model: 2016 (2.0*1.6mm) -4PIN
Pins: 4
Chip size: 2.0*1.6mm